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[rom_e2e] remove flaky flash ECC error test cases
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This removes 2 flash ECC error test cases that were brittle since the
test was self-corrupting itself (by design) in locations where test code
could be executing.

Signed-off-by: Tim Trippel <[email protected]>
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timothytrippel committed Aug 21, 2024
1 parent e370378 commit e0a468f
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Showing 2 changed files with 4 additions and 11 deletions.
Original file line number Diff line number Diff line change
Expand Up @@ -22,7 +22,6 @@ load(
)
load(
"//rules/opentitan:defs.bzl",
"cw310_params",
"fpga_params",
"opentitan_binary",
"opentitan_test",
Expand Down Expand Up @@ -87,18 +86,14 @@ FLASH_ECC_ERROR_CAUSES = [
"cause": "manifest_extension_spx_signature",
"id": 12,
},
# We only test corrupting the first flash word since this is likely not in
# the range of test code that needs to execute successfully to drive the
# test, but still exercising the scenario of a flash corruption happening
# in the code region.
{
"cause": "code_first_word",
"id": 13,
},
{
"cause": "code_middle_word",
"id": 14,
},
{
"cause": "code_last_word",
"id": 15,
},
]

BOOT_POLICY_FLASH_ECC_ERROR_TESTS = [
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Original file line number Diff line number Diff line change
Expand Up @@ -186,8 +186,6 @@ static const corruption_word_t kWords2Corrupt[] = {

// Code corruption offsets.
{.offset = kCodeFirstWordOffset, .description = "code_first_word"},
{.offset = kCodeMiddleWordOffset, .description = "code_middle_word"},
{.offset = kCodeLastWordOffset, .description = "code_last_word"},
};

static void init_peripherals(void) {
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