chip_testplan.hjson

// Copyright lowRISC contributors (OpenTitan project).
// Licensed under the Apache License, Version 2.0, see LICENSE for details.
// SPDX-License-Identifier: Apache-2.0
{
  name: "chip"

  // TODO: remove the common testplans if not applicable
  import_testplans: [
    "hw/dv/tools/dvsim/testplans/csr_testplan.hjson",
    // TODO #5484, comment these 2 lines out because spi host memory is dummy
    // "hw/dv/tools/dvsim/testplans/mem_testplan.hjson",
    // Integrity error is tested in a SW test.
    "hw/dv/tools/dvsim/testplans/tl_device_access_types_wo_intg_testplan.hjson",
    "hw/ip/tlul/data/tlul_testplan.hjson",
    "sw/device/silicon_creator/rom/data/rom_e2e_testplan.hjson",
    "hw/top_earlgrey/data/chip_conn_testplan.hjson",

    // Manufacturing test cases are part of the Silicon Validation (SiVal) test plan.
    "sw/device/silicon_creator/manuf/data/manuf_testplan.hjson"

    // Cryptolib tests are also part of silicon validation.
    "sw/device/lib/crypto/data/crypto_testplan.hjson"

    // IP block specific top level test plans.
    "hw/top_earlgrey/data/ip/chip_adc_ctrl_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_aes_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_alert_handler_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_aon_timer_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_clkmgr_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_csrng_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_edn_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_entropy_src_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_flash_ctrl_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_gpio_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_hmac_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_i2c_testplan.hjson"
    "hw/top_earlgrey/data/ip/chip_keymgr_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_kmac_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_lc_ctrl_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_otbn_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_otp_ctrl_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_pwm_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_pwrmgr_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_rom_ctrl_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_rstmgr_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_rv_core_ibex_testplan.hjson"
    "hw/top_earlgrey/data/ip/chip_rv_dm_testplan.hjson"
    "hw/top_earlgrey/data/ip/chip_rv_plic_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_rv_timer_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_spi_device_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_spi_host_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_sram_ctrl_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_sysrst_ctrl_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_uart_testplan.hjson",
    "hw/top_earlgrey/data/ip/chip_usbdev_testplan.hjson",
  ]

  testpoints: [
    ///////////////////////////////////////////////////////////////////////////
    // IO Peripherals                                                        //
    // I2C, SPIDEV, USB, PINMUX & PADCTRL, PATTGEN, PWM                      //
    ///////////////////////////////////////////////////////////////////////////


    // USB (pre-verified IP) integration tests:
    {
      name: chip_sw_usb_suspend
      desc: '''Verify that the USB device can detect the presence of VBUS from the USB host.

            - This test extends from `chip_usb_fs_df_tx_rx`, add below at the end of the sequence.
            - Configure USB device to enter `Suspend` state and ensure `link_suspend` interrupt is
              triggered.
            - Test these 2 power modes.
              - Normal sleep:
                - Configure pwrmgr to enter normal sleep mode, then clocks are disable while powers
                  are kept on.
                - Resume the device through pinmux and check the `link_resume` interrupt.
                - Ensure that previously enumerated information is kept.
              - Deep sleep:
                - Before entering deep sleep, store previously enumerated information in retention
                  RAM. (optional)
                - Configure pwrmgr to enter deep sleep mode, and powers are turned off.
                - Resume the device through pinmux and check the `link_resume` interrupt.
                - Ensure that previously enumerated information and configuration (non-default
                  values) are wiped, as USB has been reset before wakeup.
                - Restore previously enumerated information (if it's stored) or re-enumerate the
                  USB.
            - Re-enable data transfer and ensure data correctness.
            '''
      stage: V3
      si_stage: NA
      tests: []
    }

    // PINMUX & PADRING (pre-verified IP) integration tests:
    {
      name: chip_pin_mux
      desc: '''Verify the MIO muxing at input and output sides.

            - Enable `stub_cpu` mode.
            - Add a forcing interface to pinmux's pad-facing DIO and MIO ports, including the output
              enables; and a sampling interface for the peripheral facing DIO and MIO ports.
            - Similarly, add a driving / sampling interface for all DIOs and MIOs at the chip pads.
            - In the output direction:
              - Program all MIO outsel and pad attribute registers to random values.
              - Force the pad-facing pinmux MIO ports and output enables to random values.
              - Verify all MIO pad values for correctness.
            - For the input direction:
              - Program all MIO insel and pad attribute registers to random values.
              - Drive the MIO pads to random values.
              - Probe and sample the peripheral facing MIO ports of the pinmux and verify the values
                for correctness.
            - Follow a similar testing procedure for DIOs.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_padctrl_attributes"]
      bazel: ["//sw/device/tests:gpio_pinmux_test"]
    }
    {
      name: chip_padctrl_attributes
      desc: '''Verify pad attribute settings for all MIO and DIO pads.

            - Follow the same procedure as the `chip_pin_mux` test, ensuring the padctrl attribute
              registers for all MIOs and DIOs are also randomized when verifying the outcomes.
            - Verify weak pull enable, output inversion and virtual open drain and drive strength
              (bit 0) signaling in the output direction.
            - Verify weak pull enable and input inversion in the input direction.
            - Verify multiple pad attributes for each pad set at the same time through
              randomization.

            Cross-references the `chip_pin_mux` test.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_padctrl_attributes"]
      bazel: ["//sw/device/tests:gpio_pinmux_test"]
    }
    {
      name: chip_sw_sleep_pin_mio_dio_val
      desc: '''Verify the MIO output values in any sleep states.

            - Pick between normal sleep and deep sleep randomly
            - Pick between tie-0, tie-1, or High-Z randomly for all muxed,
              dedicated outputs coming from non-AON IPs.

            SW programs the MIO OUTSEL CSRs to ensure that in sleep it randomly picks
            between tie-0, tie-1 or hi-Z for all muxed outputs coming from non-AON IPs. If an AON
            peripheral output is muxed, then that peripheral's output is selected to ensure in deep
            sleep the peripheral can continue its signaling even in deep sleep. The testbench
            verifies the correctness of the reflected values once the chip goes into deep sleep.
            This is replicated for DIO pins as well.

            In this test, passthrough feature is not tested. The feature is
            covered in other tests such as chip_sw_sleep_pwm_pulses.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_sleep_pin_mio_dio_val"]
      bazel: ["//sw/device/tests:sleep_pin_mio_dio_val_test"]
    }
    {
      name: chip_sw_sleep_pin_wake
      desc: '''Verify pin wake up from any sleep states.

            Verify one of the 8 possible MIO or DIO pad inputs (randomly configured) can cause the
            chip to wake up from sleep state. Verifying wake on posedge is sufficient for the chip
            level integration testing. Upon wake up, SW reads the wake cause CSR to verify
            correctness.

            For V3, enhance this test to configure all wakeup detectors rather than configure only
            one, then have the host randomly pick one of the IOs configured for wakeup in one of
            those detectors. Also, randomize and test all wakeup modes and enable debounce filter.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_sleep_pin_wake"],
      bazel: ["//sw/device/tests:sleep_pin_wake_test"]
    }
    {
      name: chip_sw_sleep_pin_retention
      desc: '''Verify the retention logic in pinmux that is activated during deep sleep.

            - Pick a pin (such as GPIO0) and enable it in output mode. Set a known value to it (0 or
              1) and verify the correctless of the value on the chip IO.
            - Program the pin's retention value during deep sleep to be opposite of the active power
              value programmed in the previous step.
            - Reuse an existing deep sleep / low power wake up test, such as
              `chip_sw_sleep_pin_wake` test to enter low power.
            - Once the chip enters the deep sleep state, verify that this pin holds the correct
              retention value throughout the low power state.
            - Wake up the chip from sleep using the chosen method.
            - Verify the pin value at the chip IOs is no longer holding the retention value once the
              chip is back in active power.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_sleep_pin_retention"]
      bazel: ["//sw/device/tests:sleep_pin_retention_test"],
    }
    {
      name: chip_sw_tap_strap_sampling
      desc: '''Verify tap accesses in different LC states.

            Verify pinmux can select the life_cycle, RISC-V, and DFT taps after reset.
            Verify that in TEST_UNLOCKED* and RMA states, pinmux can switch between the three TAPs
            without issuing reset.
            Verify in PROD state, only the LC tap can be selected.
            Verify in DEV state, only the LC tap and RISC-V taps can be selected.
            Verify DFT test mode straps are sampled and output to AST via
            top_earlgrey.dft_strap_test_o in TEST_UNLOCKED* and RMA states.
            Verify top_earlgrey.dft_strap_test_o is always 0 in the states other than TEST_UNLOCKED*
            and RMA, regardless of the value on DFT SW straps.
            Verify loss of DFT functionality when DFT straps are deasserted on the next POR cycle.

            Note: these tests require the ROM init stage to complete. So a test ROM image is loaded,
            but the software does not test anything. The CPU boots and runs to completion while the
            host (SV testbench) performs these stimulus / checks.
            '''
      stage: V2
      si_stage: SV2
      lc_states: ["TEST_UNLOCKED", "DEV", "PROD", "RMA"]
      tests: ["chip_tap_straps_dev", "chip_tap_straps_prod", "chip_tap_straps_rma",
              "chip_tap_straps_testunlock0"]
      bazel: ["//sw/device/tests:rv_dm_jtag_tap_sel_test_unlocked1",
              "//sw/device/tests:rv_dm_jtag_tap_sel_dev",
              "//sw/device/tests:rv_dm_jtag_tap_sel_prod",
              "//sw/device/tests:rv_dm_jtag_tap_sel_rma"],
    }

    // PATTGEN (pre-verified IP) integration tests:
    {
      name: chip_sw_pattgen_ios
      desc: '''Verify pattern generation to chip output pads.

            - Program the pattgen to generate a known pattern in each lane.
            - Program the pinmux to route the chosen output to the chip IOs.
            - Verify that the correct pattern is seen on the IOs by hooking up the pattgen monitor.
            - Validate the reception of the done interrupt.
            - Verify both pattgen channels independently.

            Notes for silicon targets:
            - Repeat the above test for different patterns and lengths.
            - Repeat the above test for different clock divider.
            - Repeat the above test for different repeat values.
            - Repeat the above test with the clock inverted.
            - Repeat the above test while using both channels at the same time.
            - Monitor the clock and data pins on the silicon test setup.
            '''
      features: [
        "PATTGEN.CHANNEL.ONE",
        "PATTGEN.CHANNEL.TWO",
        "PATTGEN.CONFIG.PATTERN",
        "PATTGEN.CONFIG.DIVIDER",
        "PATTGEN.CONFIG.REPEAT",
        "PATTGEN.CONFIG.POLARITY",
        "PATTGEN.COMPLETE"
      ]
      stage: V2
      si_stage: SV2
      lc_states: ["PROD"]
      tests: ["chip_sw_pattgen_ios"]
      bazel: ["//sw/device/tests:pattgen_ios_test"]
    }

    // PWM (pre-verified IP) integration tests:
    {
      name: chip_sw_sleep_pwm_pulses
      desc: '''Verify PWM signaling to chip output pads during deep sleep.

            - Program each PWM output to pulse in a known pattern.
            - Program the pinmux to route the chosen PWM output to the chip IOs.
            - Program the pwrmgr to go to deep sleep state, with AON timer wakeup.
            - Initiate the sleep state by issuing a WFI.
            - Verify that in the sleep state, the PWM signals are active and pulsing correctly, by
              hooking up the PWM monitor.
            - Repeat the steps for all 6 PWM signals.

            Notes for silicon targets:
            - Instead of using the PWM monitor, the PWM signals should be tested by measuring the actual output pins.
            - The sampling frequency should be high enough to measure the duty cycle accurately.
            - Repeat this test with:
              - At least two different values of the duty cycle.
              - All channels set to blinking.
              - All channels set to heartbeat.
              - All channels set to reverse polarity.
              - At least two different values of the clock divider.
              - Each odd PWM channel set to be 180 degrees out of phase of the even ones.
            '''
      features: [
        "PWM.DUTYCYCLE",
        "PWM.BLINK",
        "PWM.HEARTBEAT",
        "PWM.POLARITY",
        "PWM.CLOCKDIVIDER",
        "PWM.PHASEDELAY"
      ]
      stage: V2
      si_stage: SV2
      lc_states: ["PROD"]
      tests: ["chip_sw_sleep_pwm_pulses"]
      bazel: ["//sw/device/tests:sleep_pwm_pulses_test"]
    }

    //////////////////////////////////////////////////////////////////////////////////////
    // System Peripherals                                                               //
    // XBAR, RV_DM, RV_TIMER, AON_TIMER, PLIC, CLK/RST/PWR MGR, ALERT_HANDLER,          //
    // SYSRST_CTRL                                                                      //
    //////////////////////////////////////////////////////////////////////////////////////

    // XBAR (pre-verified IP) tests:
    {
      name: chip_sw_data_integrity
      desc: '''
            Verify the alert signaling mechanism due to integrity violations of load ops.

            An SW test which performs the following on main and retention SRAMs to verify the memory
            end-to-end integrity scheme:
            - Corrupt a random data / integrity bit in the memory using SV force.
            - SW reads that address and the corrupted data is sent to ibex.
            - Verify that ibex detects the integrity violation and triggers an alert.
            - Check the alert up to the NMI phase and make sure that the alert cause is from Ibex.
            '''
      stage: V2
      si_stage: NA
      tests: ["chip_sw_data_integrity_escalation"]
    }
    {
      name: chip_sw_instruction_integrity
      desc: '''
            Verify the alert signaling mechanism due to integrity violations of instruction fetches.

            An SW test which performs the following on main SRAM to verify the memory end-to-end
            integrity scheme:
            - Corrupt a data / integrity bit in a test function in the main SRAM using SV force.
            - SW jumps to that test function in the main SRAM.
            - Verify that ibex detects the integrity violation and triggers an alert.
            - Check the alert up to the NMI phase and make sure that the alert cause is from Ibex.
            '''
      stage: V2
      si_stage: NA
      tests: ["chip_sw_data_integrity_escalation"]
    }

    ////////////////////////
    // Analog Peripherals //
    // AST, SENSOR_CTRL   //
    ////////////////////////

    // AST (pre-verified IP) integration tests:
    {
      name: chip_sw_ast_clk_outputs
      desc: '''Verify that the AST generates the 4 clocks when requested by the clkmgr.

            Verify the clock frequencies are reasonably accurate. Bring the chip to deep sleep,
            and verify that upon wakeup reset the clock counters are turned off, measure ctrl
            regwen is enabled, and errors are not cleared.
            '''
      stage: V2
      si_stage: NA
      tests: ["chip_sw_ast_clk_outputs"]
    }
    {
      name: chip_sw_ast_clk_rst_inputs
      desc: '''Verify the clk and rst inputs to AST (from `clkmgr`).

            Create different scenarios that affect the clocks and resets and see that the AST features
            (RNG, entropy, alert, ADC) that use those clocks/resets behave correctly.
            sequence:
            1. Check that AST RNG generates data and fills the entropy source fifo
            2. Create AST alerts
            3. Activate ADC conversion
            4. EDN entropy supply to AST
            Enter sleep/deep sleep/ stop IO/USB clocks
            Repeat 1-4 to check it is ok.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_ast_clk_rst_inputs"]
      bazel: []
    }
    {
      name: chip_sw_ast_sys_clk_jitter
      desc: '''Verify that the AST sys clk jitter control.

            X-ref with chip_sw_clkmgr_jitter
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_clkmgr_jitter",
              "chip_sw_flash_ctrl_ops_jitter_en",
              "chip_sw_flash_ctrl_access_jitter_en",
              "chip_sw_otbn_ecdsa_op_irq_jitter_en",
              "chip_sw_aes_enc_jitter_en",
              "chip_sw_hmac_enc_jitter_en",
              "chip_sw_keymgr_key_derivation_jitter_en",
              "chip_sw_kmac_mode_kmac_jitter_en",
              "chip_sw_sram_ctrl_scrambled_access_jitter_en",
              "chip_sw_edn_entropy_reqs_jitter"]
      bazel: []
    }
    {
      name: chip_sw_ast_usb_clk_calib
      desc: '''Verify the USB clk calibration signaling.

            - First place the AST into a mode where usb clock frequency significantly deviates from
              the ideal.
            - Verify the clock is "off" using the clkmgr measurement mechanism.
            - Then, turn on the usb sof calibration machinery and wait a few mS.
            - Afterwards, measure the usb clock again using the clkmgr measurement controls, at this
              point the clock should be significantly more accurate.
            - Note, while the above is ideal, usbdev chip level testing is not yet ready and this
              test fakes the usb portion through DV forces.
            - Note also the real AST calibration logic is not available, so the sof testing in the
              open source is effectively short-circuited.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_usb_ast_clk_calib"]
      bazel: []
    }

    // SENSOR_CTRL tests:
    {
      name: chip_sw_sensor_ctrl_ast_alerts
      desc: '''Verify the alerts from AST aggregating into the sensor_ctrl.

               Check that each AST event can be triggered from sensor_ctrl.
               Configure alert handler to reset for both fatal and recoverable
               alerts. Configure each alert source as fatal or recoverable,
               and as enabled or disabled checking against resets.
             '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_pwrmgr_sleep_sensor_ctrl_alert_wakeup",
              "chip_sw_sensor_ctrl_alert"]
      bazel: ["//sw/device/tests:sensor_ctrl_alert_test", "//sw/device/tests:sensor_ctrl_wakeup_test"]
    }
    {
      name: chip_sw_sensor_ctrl_ast_status
      desc: '''Verify the io power ok status from AST.

               Check that when the IO POK status changes, an interrupt is triggered
               from sensor_ctrl.  After triggering, the IO status can be read
               from a sensor_ctrl register.
            '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_sensor_ctrl_status"]
      bazel: []
    }
    {
      name: chip_sw_pwrmgr_sleep_sensor_ctrl_alert_wakeup
      desc: '''Verify the sensor control is able to wake the device
               from sleep mode when an alert event is triggered from
               AST. X-ref'ed chip_sw_pwrmgr_sleep_all_wake_ups.
             '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_pwrmgr_sleep_sensor_ctrl_alert_wakeup"]
      bazel: ["//sw/device/tests:sensor_ctrl_alert_test", "//sw/device/tests:sensor_ctrl_wakeup_test"]
    }

    ////////////////////////////
    // System level scenarios //
    ////////////////////////////
    {
      name: chip_sw_example_tests
      desc: '''Provide example tests for different testing scenarios / needs.

            These tests do not verify the hardware. They are meant to serve as a guide for
            developing actual tests under different testing scenarios. These example tests
            demonstrate the capabilities of the DV infrastructure which enables these scenarios:

            1. Implement test in the ROM stage itself
            2. Implement test in the flash stage, using test ROM
            3. Implement test in the flash stage, using production ROM
            4. Enable external maufacturer hooks in existing tests developed in the open source
            5. Enable concurrent threads in tests
            '''
      stage: V1
      si_stage: NA
      tests: ["chip_sw_example_rom",
              "chip_sw_example_flash",
              "chip_sw_example_manufacturer",
              "chip_sw_example_concurrency"
              ]
    }
    {
      name: chip_sw_smoketest
      desc: '''Run smoke tests developed for each IP.

            The smoke tests are developed by the SW team to test each IP is
            alive, and can be actuated by the DIF. We need to ensure that they
            work in DV as well.
            '''
      stage: V2
      si_stage: SV2
      lc_states: ["PROD"]
      tests: ["chip_sw_aes_smoketest",
              "chip_sw_aon_timer_smoketest",
              "chip_sw_clkmgr_smoketest",
              "chip_sw_csrng_smoketest",
              "chip_sw_entropy_src_smoketest",
              "chip_sw_gpio_smoketest",
              "chip_sw_hmac_smoketest",
              "chip_sw_kmac_smoketest",
              "chip_sw_otbn_smoketest",
              "chip_sw_pwrmgr_smoketest",
              "chip_sw_pwrmgr_usbdev_smoketest",
              "chip_sw_rv_plic_smoketest",
              "chip_sw_rv_timer_smoketest",
              "chip_sw_rstmgr_smoketest",
              "chip_sw_sram_ctrl_smoketest",
              "chip_sw_uart_smoketest",
              "chip_sw_flash_scrambling_smoketest",
            ]
      bazel: [
        "//sw/device/tests:aes_smoketest",
        "//sw/device/tests:aon_timer_smoketest",
        "//sw/device/tests:clkmgr_smoketest",
        "//sw/device/tests:csrng_smoketest",
        "//sw/device/tests:entropy_src_smoketest",
        "//sw/device/tests:gpio_smoketest",
        "//sw/device/tests:hmac_smoketest",
        "//sw/device/tests:kmac_smoketest",
        "//sw/device/tests:otbn_smoketest",
        "//sw/device/tests:pmp_smoketest_napot",
        "//sw/device/tests:pmp_smoketest_tor",
        "//sw/device/tests:pwrmgr_smoketest",
        "//sw/device/tests:rstmgr_smoketest",
        "//sw/device/tests:rv_plic_smoketest",
        "//sw/device/tests:rv_timer_smoketest",
        "//sw/device/tests:pwrmgr_usbdev_smoketest",
        "//sw/device/tests:spi_host_smoketest",
        "//sw/device/tests:sram_ctrl_smoketest",
        "//sw/device/tests:uart_smoketest",
      ]
    }
    {
      name: chip_sw_otp_smoketest
      desc: '''Run smoke tests developed for OTP.

            This smoketest is separated from the chip_sw_smoketest since it
            cannot be executed in silicon owner stage.
            '''
      stage: V2
      si_stage: SV2
      lc_states: ["PROD"],
      boot_stages: ["rom_ext"],
      tests: ["chip_sw_otp_ctrl_smoketest"],
      bazel: ["//sw/device/tests:otp_ctrl_smoketest"],
    }
    {
      name: chip_sw_rom_functests
      desc: '''Run some ROM functional tests with test ROM.

            ROM functional tests test ROM drivers and libraries by exercising
            these components in the flash stage, launched via the test ROM. They
            primarily are tested on the FPGA, however, we ensure they run in DV
            as well.
            '''
      stage: V2
      si_stage: NA
      tests: ["rom_keymgr_functest"]
    }
    {
      name: chip_sw_coremark
      desc: '''Run the coremark benchmark on the full chip.'''
      stage: V3
      si_stage: SV4
      lc_states: ["PROD"]
      tests: ["chip_sw_coremark"]
      bazel: ["//third_party/coremark/top_earlgrey:coremark_test"]
    }
    {
      name: chip_sw_boot
      desc: '''Verify the full flash image download with bootstrap signal set.

            - SW puts the SPI device in firmware mode
            - Load a firmware image (bootstrap) through spi input pin to the spi_device memory.
            - SW verifies the integrity of the image upon reception by reading the spi_device
              memory.
            - Ensure the image is executed correctly

             Note: This flow will be replaced by using spi_device flash mode.
             For detail, refer to chip_spi_device_flash_mode
             '''
      stage: V2
      si_stage: NA
      tests: ["chip_sw_uart_tx_rx_bootstrap"]
    }
    {
      name: chip_sw_secure_boot
      desc: '''Verify the secure boot flow.

             X-ref rom_e2e_smoke.
             In reality this can be any rom based test, which requires secure boot.
             '''
      stage: V2
      si_stage: NA
      tests: ["rom_e2e_smoke"]
    }
    {
      name: chip_sw_rom_raw_unlock
      desc: '''Configure RAW_UNLOCK via LC TAP interface and enable CPU execution.

            This test characterizes the DUT initial state before RAW unlock operation, and
            switches to external clock via clkmgr to ensure the system clock can be switched
            right after transition into test_unlcoked0 state. The test also verifies that
            AST is not initialized while CPU is executing code.

             - Pre-load OTP image with RAW lc_state.
             - Initiate the LC transition to test_unlocked0 state using the
               RAW_UNLOCK mode of operation.
             - Switch TAP interface to rv_dm and configure the ROM_EXEC_EN OTP to enable ROM
               execution.
             - If running with the production ROM, enable signature verification via OTBN to
               improve simulation time.
             - Perform POR to apply OTP changes.
             - With rv_dm TAP still selected, switch to external clock via clkmgr using extclk
               slow mode configuration.
             - Wait for ROM to start executing code.
             - Check AST init done equal to 0 via sensor_ctrl.
             '''
      stage: V2
      si_stage: NA
      tests: ["rom_raw_unlock"]
    }
    {
      name: chip_sw_power_max_load
      desc: '''Concurrency test modeling maximum load conditions.

      This concurrency test runs multiple blocks at the same time, to simulate
      maximum load ("power virus test"). Should be combined with low power
      entry and exit scenarios.

      The test should be made configurable so that the type of power state and
      the time spent in a particular power state can be configured via a
      flag (or similar). This will make it easier to reuse the test for power
      simulation and characterization later on.

      The test should set a GPIO (mapped to the IOA2 pin) to high while the power
      state of interest is active.

      Blocks / functionality to run simulatenously in this test:

        - The ADC is continuously sampling new data
        - Staggered activation of OTBN, aes, KMAC/HMAC.
          - KMAC / aes would need to take turns being fed data
          - KMAC activation should be a combination of otp background, key
            manager background and software
          - for OTBN, any signature verification / signing event is sufficient
        - Entropy complex ongoing
          - reseed / update operation ongoing
        - Flash scramble ongoing (ideally both instruction and data, but data should be sufficient
          for now)
          - instruction scrambling gated by script availability
        - Simultaneous IO toggling as defined below
          - ideally for digital activity, 3xUART / I2C modules should be activated
            - for first pass simplicity can activate IO portion only for now through GPIO
          - for dedicated pins, focus on SPI device quad activity
          - USB activity should be activated
            - for first pass simplicity activate IO portion only for now via pin forcing in usbdev.
        - Ongoing cpu activity (icache / SRAM scrambling both activated)
          - servicing ongoing threads and random read/write data to memory
          - icache needs to be activated, otherwise the system may spend most of its time fetching
            code
        - Background checks enabled wherever possible
          - rstmgr background checks
          - alert_handler ping checks
          - OTP background checks
        - The test should be run both with / without external clock

      This test should leverage the OTTF test framework for supporting
      concurrency in a FreeRTOS environment. See also the design docs linked
      in #14095 for more details on how to approach the implementation.
      '''
      stage: V3
      si_stage: SV2
      lc_states: ["PROD"]
      tests: ["chip_sw_power_virus"]
      bazel: ["//sw/device/tests:power_virus_systemtest"]
    }
    {
      name: chip_sw_power_idle_load
      desc: '''Concurrency test modeling load conditions in idle state

      This concurrency test models an average idle scenarios.

      The test should be made configurable so that the type of power state and
      the time spent in a particular power state can be configured via a
      flag (or similar). This will make it easier to reuse the test for power
      simulation and characterization later on.

      The test should set a GPIO (mapped to the IOA2 pin) to high while the power
      state of interest is active.

      The test should cover the following scenarios:

        - Processor polls for nmi interrupt
        - Background checks enabled wherever possible
          - rstmgr background checks
          - alert_handler ping checks
          - OTP background checks
        - Timers (regular and AON) are active
        - Check whether transactional clocks should be enabled or disabled
        - Check whether PWM should be active
      '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_power_idle_load"]
      bazel: ["//sw/device/tests:chip_power_idle_load_test"]
    }
    {
      name: chip_sw_power_sleep_load
      desc: '''Concurrency test modeling load conditions in idle state

      This concurrency test models average sleep scenarios.

      The test should be made configurable so that the type of power state and
      the time spent in a particular power state can be configured via a
      flag (or similar). This will make it easier to reuse the test for power
      simulation and characterization later on.

      The test should cover the following scenarios:

        - System can be in deep or light sleep
        - The system has the following AON / IO activity:
          - aon_timer active
          - adc_ctrl active in low power mode
          - TBD: check whether sysrst_ctrl and pinmux wakeup detectors should be active
          - TBD: check whether PWM should be active

      This test should leverage the OTTF test framework for supporting
      concurrency in a FreeRTOS environment. See also the design docs linked
      in #14095 for more details on how to approach the implementation.
      '''
      stage: V2
      si_stage: SV3
      lc_states: ["PROD"]
      tests: ["chip_sw_power_sleep_load"]
      bazel: ["//sw/device/tests:chip_power_sleep_load_test"]
    }

    {
      name: chip_sw_exit_test_unlocked_bootstrap
      desc: '''End to end test to ensure rom boot strap can be performed after
      transitioning from TEST state to PROD state.

      - Pre-load the device into TEST_UNLOCKED state and ROM_EXEC_EN = 0.
      - In the same power cycle, advance device to PROD, PROD_END or DEV through LC JTAG request and
        set ROM_EXEC_EN in OTP to logically true.
      - Reboot the device and perform boot strap of a simple image, (e.g Hello World).
      - Ensure boot strap succeeds.

      X-ref'ed with manuf_ft_exit_token from manufacturing test plan.
      '''
      stage: V2
      si_stage: NA
      tests: ["chip_sw_exit_test_unlocked_bootstrap"]
    }

    {
      name: chip_sw_inject_scramble_seed
      desc: '''End to end test to ensure boot strap can succeed after injecting scramble seeds.

      - Pre-load the device into PROD, PROD_END or DEV state.
      - Backdoor load an unscrambled value into flash isolated partition.
      - In the test program, populate the scramble seeds (flash / sram).
      - In the test program, populate OTP entries to inform ROM to scramble flash upon next boot.
      - Reboot the device and perform boot strap of the same test image, ROM should now program
        the flash image with scramble enabled.
      - Upon successful boot strap, ROM jumps to the newly programmed image and de-scrambles the
        instructions.
      - In the test program, check whether the OTP partition containing the scramble seeds is
        locked. Also check that the unscrambled value progarmmed into flash isolated partition
        can be correctly read back when the region is set to scramble disable.
      - If either of the above checks is incorrect, return error.


      X-ref'ed with manuf_ft_sku_individualization from manufacturing test plan.
      '''
      stage: V2
      si_stage: NA
      tests: ["chip_sw_inject_scramble_seed"]
    }
  ]
}