[opentitanlib] add DFT disabling strap config and workaround #20683
Conversation
This file contains bidirectional Unicode text that may be interpreted or compiled differently than what appears below. To review, open the file in an editor that reveals hidden Unicode characters.
Learn more about bidirectional Unicode characters
|
@jesultra The original mechanism we discussed did not work, potentially due to OT overriding the weak pull-downs that cause UART frames to be missed, so after some discussion with @cfrantz, we opted for a command line flag that defaults to false (since this special strapping config is only needed during provisioning in TEST_UNLOCKED* LC states anyway). |
moidx
approved these changes
Dec 20, 2023
timothytrippel
force-pushed
the
fix-dft-strap-issue
branch
from
43b1457 to
af73135
Compare
a-will
reviewed
Dec 20, 2023
This updates the CP provisioning test harness and firmware to make it reentrant at later lifecycle stages. Signed-off-by: Tim Trippel <[email protected]>
This updates the FT provisioning test harness and firmware to make it reentrant at later lifecycle stages. Signed-off-by: Tim Trippel <[email protected]>
This reset is unnecessary because the we perform a bootstrap when we load the next personalization binary. Signed-off-by: Tim Trippel <[email protected]>
The final personalization binary has not been completed (certificate templates are missing), so it has been temporarily disabled. Signed-off-by: Tim Trippel <[email protected]>
This reduces the RMA unlock token data regex string to make the provisioning flow more reliable. Signed-off-by: Tim Trippel <[email protected]>
timothytrippel
force-pushed
the
fix-dft-strap-issue
branch
from
af73135 to
1ccc23b
Compare
This consolidates the LC state read code into a testutil for reuse across test harnesses. Additionally, this fixes a bug in the FT provisioning test harness that was making an incorrect assumption about the current LC state of the device. Signed-off-by: Tim Trippel <[email protected]>
DFT straps were put on the same pins as the console UART (IOC3 and 4). This causes JTAG reliability issues in test unlocked states if we do not pull the straps low when they should be sampled. This provides a software workaround. Signed-off-by: Tim Trippel <[email protected]>
timothytrippel
force-pushed
the
fix-dft-strap-issue
branch
from
1ccc23b to
e430a6a
Compare
Sign up for free
to join this conversation on GitHub.
Already have an account?
Sign in to comment
Add this suggestion to a batch that can be applied as a single commit.
This suggestion is invalid because no changes were made to the code.
Suggestions cannot be applied while the pull request is closed.
Suggestions cannot be applied while viewing a subset of changes.
Only one suggestion per line can be applied in a batch.
Add this suggestion to a batch that can be applied as a single commit.
Applying suggestions on deleted lines is not supported.
You must change the existing code in this line in order to create a valid suggestion.
Outdated suggestions cannot be applied.
This suggestion has been applied or marked resolved.
Suggestions cannot be applied from pending reviews.
Suggestions cannot be applied on multi-line comments.
Suggestions cannot be applied while the pull request is queued to merge.
Suggestion cannot be applied right now. Please check back later.
DFT straps were put on the same pins as the console UART (IOC3 and 4). This causes JTAG reliability issues in test unlocked states if we do not pull the straps low when they should be sampled. This provides a software workaround.
Note: this depends on #20682, only review the last commit.
This replaces #20622.